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Focused ion beam
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111	日本化学会春季年会予稿原稿雛型 Add to Reading List Source URL: www.mri-jma.go.jp Language: English - Date: 2013-02-12 00:22:40 Electron microscopy Mass spectrometry Focused ion beam Nanoparticle Transmission electron microscopy Electron microscope Particle Electron Time of flight Scientific method Science Chemistry
112	Version 01.01, [removed]ZEISS NVision 40 FIB/SEM PROCEDURE SPECIAL NOTES OR RESTRICTIONS: • Add to Reading List Source URL: www.nist.gov Language: English - Date: 2013-01-18 08:43:38 Double-click Science Semiconductor device fabrication Focused ion beam Electron microscopy Fib GUI widget
113	Nanoscale Strength Measurements and Standards Objective Impact and Customers • The MEMS industry currently generates revenues of about $45B/year, dominated by two non-contact devices: inkjet Add to Reading List Source URL: www.nist.gov Language: English - Date: 2012-10-04 11:43:10 Semiconductor device fabrication Glass physics Nanotechnology Etching Microelectromechanical systems Deep reactive-ion etching Nanoelectromechanical system Fracture Focused ion beam Materials science Chemistry Microtechnology
114 $Scanning electron microscope / Electron microscope / Focused ion beam / Electron backscatter diffraction / Failure analysis / Nanometrology / Microscope / Characterization / Phenom / Scientific method / Science / Electron microscopy$	Who Are We? The Nondestructive Analysis (NOVA) Center located at Western Kentucky University is the only facility of its kind at a North American University, home to one of the world’s largest Large Chamber Scanning E Add to Reading List Source URL: www.largechamber.com Language: English - Date: 2012-03-05 10:13:47 Scanning electron microscope Electron microscope Focused ion beam Electron backscatter diffraction Failure analysis Nanometrology Microscope Characterization Phenom Scientific method Science Electron microscopy
115 $Chemistry / Electron microscope / Microscopy and Microanalysis / Microscopy / Focused ion beam / Electron diffraction / Microscope / Nestor J. Zaluzec / Scientific method / Science / Electron microscopy$	DISCOVER the SAVE THE DATE M&M 2014 is FOUR FULL DAYS of sessions, Add to Reading List Source URL: www.microscopy.org Language: English - Date: 2013-08-21 15:16:12 Chemistry Electron microscope Microscopy and Microanalysis Microscopy Focused ion beam Electron diffraction Microscope Nestor J. Zaluzec Scientific method Science Electron microscopy
116	MSA logo_blue & green_final CMYK Add to Reading List Source URL: www.microscopy.org Language: English - Date: 2012-07-06 09:54:52 Chemistry Electron microscope Microscopy Scanning electron microscope Microscope Characterization Focused ion beam Phase-contrast imaging Cathodoluminescence Scientific method Science Electron microscopy
117	Auxiliary Equipment Rapid Thermal Annealer: KNI operates a 6-inch rapid thermal annealer (RTA) for the annealing of contacts and doping into semiconductor nanostructures. This system, with an accurate pyrometer surface e Add to Reading List Source URL: www.kni.caltech.edu Language: English - Date: 2014-05-09 13:26:01 Electron microscopy Semiconductor device fabrication Thin film deposition Microtechnology Electron beam Microelectromechanical systems Focused ion beam Transmission electron microscopy Electron microscope Physics Scientific method Science
118	National Nanotechnology Infrastructure Network Vol Add to Reading List Source URL: nnin.org Language: English - Date: 2012-10-30 10:11:55 Materials science Focused ion beam Nanotechnology Nanometrology Nanolithography Microelectromechanical systems Electron beam lithography Scanning electron microscope Electron microscope Scientific method Electron microscopy Science
119	Frontiers of In Situ Transmission Electron Microscopy Add to Reading List Source URL: www.nist.gov Language: English - Date: 2013-05-29 12:06:36 Microscopes Electron beam Laboratory techniques Transmission electron microscopy Electron microscope National Center for Electron Microscopy Cryo-electron microscopy Microscopy Focused ion beam Scientific method Electron microscopy Science
120	Functional Electron Microscopy for Electrochemistry Research: From the Atomic to the Micro Scale by Albina Y. Borisevich, Miaofang Chi, and Ray Unocic T Add to Reading List Source URL: www.electrochem.org Language: English - Date: 2014-07-22 12:22:18 Chemistry Microscopes Electron beam Spectroscopy Microscopy Transmission electron microscopy Scanning transmission electron microscopy Electron microscope Focused ion beam Scientific method Electron microscopy Science

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